A methodology for the characterization of the performance of thinning algorithms
- 30 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Performance characterization in image analysis: thinning, a case in pointPattern Recognition Letters, 1992
- Thinning methodologies-a comprehensive surveyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1992
- Binary picture thinning by an iterative parallel two-subcycle operationPattern Recognition, 1987
- Axial representations of shapeComputer Vision, Graphics, and Image Processing, 1986
- A Width-Independent Fast Thinning AlgorithmPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1985
- Pattern thinning by contour tracingComputer Graphics and Image Processing, 1981
- From Local Maxima to Connected SkeletonsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1981
- Shape description using weighted symmetric axis featuresPattern Recognition, 1978