X-ray analysis technique for very high temperatures
- 1 January 1959
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 36 (1) , 16-20
- https://doi.org/10.1088/0950-7671/36/1/306
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- High Temperature X-Ray Diffraction CameraReview of Scientific Instruments, 1956
- The temperature calibration of a high temperature X-ray diffraction cameraJournal of Scientific Instruments, 1956
- The measurement of specimen temperature in a high temperature X-ray powder cameraJournal of Scientific Instruments, 1955
- A high-temperature, X-ray diffraction, powder cameraJournal of Scientific Instruments, 1955
- A simple microscope attachment for observing high-temperature phenomenaJournal of Scientific Instruments, 1954
- A High‐Temperature X‐Ray CameraJournal of the American Ceramic Society, 1954
- A pressurized high-temperature Debye-Scherrer camera, and its use to determine the structures and coefficients of expansion of γ - and δ -manganeseProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1954
- Furnace construction and thermocouple arrangements for a high temperature X-ray cameraJournal of Scientific Instruments, 1952
- Techniques for growing and mounting small single crystals of refractory compoundsJournal of Research of the National Bureau of Standards, 1952
- The A New Type of High-Temperature X-Ray Camera for Chemical Reactions in the Solid State.The Journal of Physical Chemistry, 1950