Very high frequency and microwave interferometric phase and amplitude noise measurements
- 1 January 1999
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 70 (1) , 220-225
- https://doi.org/10.1063/1.1149351
Abstract
The interferometric technique allows close-to-the-carrier measurements of both phase and amplitude noise, improving the instrument noise floor by 10–25 dB as compared to the traditional method based on a saturated mixer. Principles and basic equations describing the noise measurement system are given, together with design strategies suitable to microwave and very high frequency bands. Two prototypes, operating at 9 GHz and 100 MHz are discussed in detail. The relevant features of these prototypes are the capability to operate in a wide power range, below 0 dBm and above 20 dBm, and low noise floor. The latter is about −180 dB rad 2 / Hz (white) and 150 dB rad 2 / Hz (flicker) at 1 Hz Fourier frequency, at carrier power from 9 to 15 dBm.Keywords
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