Small Moisture Content Measurements for Nylon Chip and Granulated Sugar by Dielectric Loss Method

1 June 1977

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement

Vol. 26 (2) , 148-152
https://doi.org/10.1109/TIM.1977.4314515

Abstract

A moisture-content measuring device operating on the dielectric loss measurement principle has been developed. The device can measure the moisture content in the range of 0.1-1.5 percent consistently for the nylon chip and the granulated sugar.

Keywords

DIELECTRIC LOSS MEASUREMENT
DIELECTRIC MEASUREMENTS
LOSS MEASUREMENT
MOISTURE MEASUREMENT
SEMICONDUCTOR DEVICE MEASUREMENT
DIELECTRIC LOSSES
ELECTRODES
ELECTRICAL RESISTANCE MEASUREMENT
POWDERS
FREQUENCY MEASUREMENT

This publication has 2 references indexed in Scilit:

Dielectric Measurement of Moisture Content in Granular Materials by Substitution Method
Transactions of the Society of Instrument and Control Engineers, 1967
On The Measuring Electrodes for Moisture Content in Powdery and Granular Materials
Transactions of the Society of Instrument and Control Engineers, 1967