In-situ HVEM study of migration of bcc/glass interfaces in TiCr2, induced by 1 MeV krypton irradiation at 80–180 K
- 30 June 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 30 (1-2) , 188-192
- https://doi.org/10.1016/0304-3991(89)90186-1
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Cascade-driven migration of structural interfaces: A new type of irradiation-induced phase transformationApplied Physics Letters, 1987
- The HVEM-Tandem Accelerator Facility at Argonne National LaboratoryNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
- The Cr−Ti (chromium-titanium) systemBulletin of Alloy Phase Diagrams, 1981
- Determination of the threshold-energy surface for copper usingin-situelectrical-resistivity measurements in the high-voltage electron microscopePhysical Review B, 1981