Coefficient of linear expansion of silicon and germanium by double crystal X-ray spectrometer
- 4 April 1971
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 5 (1) , K51-K53
- https://doi.org/10.1002/pssa.2210050143
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A Versatile Vacuum Scanning Double Crystal Spectrometer for Soft X-Ray Absorption Edge StudiesPublished by Springer Nature ,1970
- Thermal Expansion of Some Crystals with the Diamond StructurePhysical Review B, 1958