Local measurement of semiconductor band bending and surface charge using Kelvin probe force microscopy
- 1 January 2005
- journal article
- research article
- Published by Elsevier in Surface Science
- Vol. 574 (2-3) , L35-L39
- https://doi.org/10.1016/j.susc.2004.10.042
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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