Quantum mechanical effects on sputter source isotope fractionation
- 1 November 1987
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 29 (1) , 83-86
- https://doi.org/10.1016/0168-583x(87)90209-6
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Measurements of the secondary ion mass spectrometry isotope effectJournal of Vacuum Science & Technology A, 1987
- Progress at the Isotrace Radiocarbon FacilityRadiocarbon, 1986
- Velocity dependence of secondary-ion emissionPhysical Review B, 1984
- Isotope fractionation in secondary ion mass spectrometryJournal of Applied Physics, 1982
- Secondary-ion emission probability in sputteringPhysical Review B, 1979
- Work-Function Dependence of Negative-Ion Production during SputteringPhysical Review Letters, 1978