Diamond anvil device for x-ray diffraction on single crystals under pressures up to 100 kilobar
- 1 May 1977
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 48 (5) , 517-523
- https://doi.org/10.1063/1.1135065
Abstract
A new high‐pressure diamond anvil device is described which allows for x‐ray diffraction intensity measurements on single crystals up to hydrostatic pressures of about 100 kilobar. The present device fits into commercial x‐ray diffractometers such as precession cameras and four‐circle diffractometers. The pressure is determined by measuring the ruby R1‐line shift with a Fabry–Pérot interferometer which is coupled to a microscope system. First measurements on Se carried out on a precession camera indicate that atomic position parameters and pressures can be determined with standard deviations of ±0.002 and ±0.7 kilobar.Keywords
This publication has 16 references indexed in Scilit:
- Modification of the diamond cell for measuring strain and the strength of materials at pressures up to 300 kilobarReview of Scientific Instruments, 1976
- Calibration of the pressure dependence of the R1 ruby fluorescence line to 195 kbarJournal of Applied Physics, 1975
- Hydrostatic limits in liquids and solids to 100 kbarJournal of Applied Physics, 1973
- An Optical Fluorescence System for Quantitative Pressure Measurement in the Diamond-Anvil CellReview of Scientific Instruments, 1973
- Pressure-Induced Electronic Collapse and Semiconductor-to-Metal Transition in EuOPhysical Review Letters, 1972
- Bond distances and chain angle of hexagonal selenium at high pressureJournal of Applied Physics, 1972
- Instrumentation for Single Crystal X-Ray Diffraction at High PressuresReview of Scientific Instruments, 1969
- Appareillage pour études radiocristallographiques sous pression et à température variableJournal of Applied Crystallography, 1968
- Single-crystal x-ray diffraction at high pressuresJournal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation, 1965
- Apparatus for X-Ray Measurements at Very High PressureReview of Scientific Instruments, 1964