Characterization of thin films on metals using proton- induced X-rays
- 1 December 1979
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 64 (3) , 445-454
- https://doi.org/10.1016/0040-6090(79)90329-8
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Applications of Ion Implantation to Metallic CorrosionIEEE Transactions on Nuclear Science, 1979
- Oxygen-shall X-Ray production in thin films of aluminum oxide by 20- to 100-keV protonsPhysical Review B, 1969
- Measurement of Microgram Surface Densities by Observation of Proton Produced X RaysReview of Scientific Instruments, 1967