Analysis of schlierengrams in refractometry of axisymmetric objects
- 15 October 1980
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 19 (20) , 3421-3422
- https://doi.org/10.1364/ao.19.003421
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 4 references indexed in Scilit:
- Reduction of data from line, differential and surface probes in axially symmetric experimentsComputer Physics Communications, 1978
- Quantitative Schlieren Techniques Applied to High Current Arc InvestigationsApplied Optics, 1972
- Zur Auswertung der Abelschen IntegralgleichungAnnalen der Physik, 1963
- Numerical Methods for Reducing Line and Surface Probe DataSIAM Review, 1960