A far-field method for characterizing thin planar optical waveguides
- 1 July 1997
- journal article
- Published by Elsevier in Optics Communications
- Vol. 139 (4-6) , 205-208
- https://doi.org/10.1016/s0030-4018(97)00125-9
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Refractive-index profiling of planar gradient-index waveguides by phase-measuring microinterferometryApplied Optics, 1994
- Characterisation of Single-Mode Asymmetric Slab Waveguide from Far Field Intensity PatternJournal of Optical Communications, 1989
- Réalisation sur LiNbO3 de guides d’ondes présentant une forte variation d’indice et de très faibles pertesAnnals of Telecommunications, 1988
- Characterisation of single-mode channel waveguides from far field measurementsOptics Communications, 1987
- Use of far-field radiation pattern to characterise single-mode symmetric slab waveguidesElectronics Letters, 1983
- Accurate method for characterising single-mode fibres: theory and experimentElectronics Letters, 1983
- Estimation of the modal field profile of single mode graded-index fibers from the far-field patternOptics Communications, 1982
- Determination of core diameter and refractive-index difference of single-mode fibres by observation of the far-field patternIEE Journal on Microwaves, Optics and Acoustics, 1976
- Optical waveguide refractive index profiles determined from measurement of mode indices: a simple analysisApplied Optics, 1976
- Beam divergence of the emission from double-heterostructure injection lasersJournal of Applied Physics, 1973