Work function spectroscopy as a tool for thin film analysis
- 1 July 1989
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 174, 149-154
- https://doi.org/10.1016/0040-6090(89)90883-3
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Application of work function measurements to the characterization of thin films and solid surfacesMicrochimica Acta, 1987
- Surface analysis by work function measurements in a Scanning Auger MicroprobeAnalytical and Bioanalytical Chemistry, 1987
- Scanning Auger and work-function measurements applied to dispenser cathodesApplications of Surface Science, 1981
- High spatial resolution surface potential measurements using secondary electronsSurface Science, 1980