Semiconductor Lifetime as a Function of Recombination State Density
- 1 October 1957
- journal article
- research article
- Published by Taylor & Francis in Journal of Electronics and Control
- Vol. 3 (4) , 375-386
- https://doi.org/10.1080/00207215708937098
Abstract
The analysis of the Shockley-Read model is extended to describe the transient behaviour. The results are compared with those already given by Fan and by Rittner, and it is concluded that the latter cease to be valid at high recombination state densities. The relation between steady state and transient measurements of photoconductivity is examined, and. some numerical examples are presented.Keywords
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