The contrast on electron micrographs caused by closely spaced edge dislocation multipoles
- 1 January 1967
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 15 (133) , 27-42
- https://doi.org/10.1080/14786436708230349
Abstract
The electron microscopic contrast which would be produced by arrays of parallel dipoles consisting of dissociated dislocations is examined. It is found that a multipole can, to a good approximation, be considered as a planar fault with the result that a multipole gives rise to fringes similar to stacking-fault fringes. Comparison between the calculated fringes and those observed in deformed Cu-Al alloys indicates that many of the observed fringes are caused by closely spaced dislocation multipoles.Keywords
This publication has 7 references indexed in Scilit:
- The self-stress of dislocations and the shape of extended nodesPhilosophical Magazine, 1964
- Equilibrium of extended dislocations within edge dislocation dipolesPhilosophical Magazine, 1964
- Dislocation configurations in deformed copper and copper 10%(atomic) aluminium alloyDiscussions of the Faraday Society, 1964
- Anomalous electron absorption effects in metal foils: theory and comparison with experimentProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1962
- Diffraction contrast of electron microscope images of crystal lattice defects. III. Results and experimental confirmation of the dynamical theory of dislocation image contrastProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1962
- Direct measurements of stacking-fault energies from observations of dislocation nodesPhilosophical Magazine, 1961
- A kinematical theory of diffraction contrast of electron transmission microscope images of dislocations and other defectsPhilosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1960