Soft X-ray emission fluctuations in the HBTX1A reversed field pinch

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Abstract
X-ray emission fluctuations from the HBTX1A reversed field pinch have been investigated with an array of silicon surface barrier diodes using statistical analysis techniques. Despite their apparent randomness a new correlation technique involving all the signals has been used to identify the dominant activity at frequencies >1. Local turbulence becomes the dominant component at higher frequencies; even so correlation lengths parallel to B are much longer than across. Correlating the X-ray diodes with magnetic edge coils enables a direct comparison of the two types of fluctuations and shows that one of the m=0 modes propagates radially outwards.