Static SIMS study of miscible blends of polystyrene and poly(vinyl methyl ether)
- 1 June 1990
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 15 (6) , 388-391
- https://doi.org/10.1002/sia.740150608
Abstract
Static secondary ion mass spectroscopy (SSIMS) is applied to study the surface of the miscible polystyrene (PS)/poly(vinyl methyl ether) (PVME) blend. The blend surface is enriched with PVME and the enrichment is shown to depend on the composition and molecular weight of the blend constituents. A semi‐quantitative analysis of SSIMS intensities to obtain surface compositions gives good qualitative agreement with previous x‐ray photoelectron spectroscopy (XPS) results.Keywords
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