A two-dimensional diffraction pattern sampling system for determining the optimum parameters of a matched spatial filter
- 1 April 1983
- journal article
- Published by Elsevier in Optics & Laser Technology
- Vol. 15 (2) , 101-104
- https://doi.org/10.1016/0030-3992(83)90099-3
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Double correlation technique for pattern recognition and countingOptics Communications, 1982
- Optimization of parameters in matched spatial filter synthesisApplied Optics, 1977
- Sources of correlation degradationApplied Optics, 1977
- Determining optimal matched filter parametersApplied Optics, 1976
- Signal detection by complex spatial filteringIEEE Transactions on Information Theory, 1964