Subpixel position measurement using 1D, 2D and 3D centroid algorithms with emphasis on applications in confocal microscopy
- 1 June 1997
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 186 (3) , 246-257
- https://doi.org/10.1046/j.1365-2818.1997.1970761.x
Abstract
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