Anomaly of X-ray Diffraction Profile in Single-Walled Carbon Nanotubes
- 1 June 1999
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 38 (6A) , L668
- https://doi.org/10.1143/jjap.38.l668
Abstract
X-ray diffraction (XRD) studies on single-walled carbon nanotube (SWNT) samples prepared by the arc-discharge method were reported. The XRD profile was basically explained to be a result of triangular packing of SWNTs with a lattice constant of 17.1 Å and an average nanotube radius of 7.1 Å. We found an anomalous change in XRD profiles before and after heat-treatment of the SWNT samples in air at ∼350°C. Combined with gravimetric measurements and resistivity measurements, a detailed simulation of the XRD profiles showed that air (oxygen, and/or nitrogen and/or water) can be condensed inside the SWNTs.Keywords
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