Determination of the Kinetic Coefficients of Silicon Self‐Interstitials from Oxygen Precipitation/Front‐Surface Stacking‐Fault Growth Experiments
- 1 November 1991
- journal article
- Published by The Electrochemical Society in Journal of the Electrochemical Society
- Vol. 138 (11) , 3492-3498
- https://doi.org/10.1149/1.2085440
Abstract
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