Measurement of film thickness up to several hundreds of nanometers using optical waveguide lightmode spectroscopy
- 26 April 2004
- journal article
- research article
- Published by Elsevier in Biosensors and Bioelectronics
- Vol. 20 (3) , 553-561
- https://doi.org/10.1016/j.bios.2004.03.005
Abstract
No abstract availableKeywords
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