Effect of biaxial stress on Si(100) inversion layers
- 31 August 1980
- journal article
- Published by Elsevier in Surface Science
- Vol. 98 (1-3) , 416-426
- https://doi.org/10.1016/0039-6028(80)90523-3
Abstract
No abstract availableKeywords
This publication has 23 references indexed in Scilit:
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- Effective masses in (100) silicon inversion layersSolid State Communications, 1977
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- Evidence for mobility domains in (100) silicon inversion layersSolid State Communications, 1976
- Effects of higher sub-band occupation in (100) Si inversion layersPhysical Review B, 1976
- Observation of Higher Sub-band in-Type (100) Si Inversion LayersPhysical Review Letters, 1975
- Negative Field-Effect Mobility on (100) Si SurfacesPhysical Review Letters, 1966