Texturing of epitaxial in situ Y-Ba-Cu-O thin films on crystalline substrates
- 4 February 1991
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 58 (5) , 540-542
- https://doi.org/10.1063/1.104580
Abstract
The degree of texturing of the grains in epitaxial in situ Y‐Ba‐Cu‐O films was studied by x‐ray pole‐figure measurements. These high Tc and Jc laser deposited films were all aligned with the c axis perpendicular to the substrate surface. It was found that films on SrTiO3(001) and LaAlO3(001) were totally aligned with the YBCO a axis parallel to the 〈100〉 direction on the substrate. For MgO(001), 4% of the grains are aligned in the 〈110〉 direction. For yttria stabilized zirconia (001), the a axes of the YBCO grains were distributed between the 〈100〉 and 〈110〉 directions on the substrate. These observations are consistent with the degree of lattice mismatch in the various crystal orientations.Keywords
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