Dynamic Thermographic Analysis System At Stress Testing

• 24 August 2005
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 1582-1583
• https://doi.org/10.1109/iembs.1990.691907

Abstract

Keywords

• THERMAL STRESSES
• SYSTEM TESTING
• IMAGE PROCESSING
• IMAGE CONVERTERS
• THERMAL CONDUCTIVITY
• CONTROL SYSTEMS
• SKIN
• INFRARED IMAGING
• RAPID THERMAL PROCESSING
• COOLING