New Technique to Measure the Toughness of Thin‐Film Interfaces
- 1 May 1995
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 78 (5) , 1397-1400
- https://doi.org/10.1111/j.1151-2916.1995.tb08503.x
Abstract
No abstract availableKeywords
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