Results of A 160 × 106 device-hour reliability assessment and failure analysis of TTL SSI integrated circuits, part 1 test results and electrical failure analysis
- 1 January 1975
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 14 (5) , 469-470
- https://doi.org/10.1016/0026-2714(75)90161-4
Abstract
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