Hot-carrier reliability design guidelines for CMOS logic circuits
- 30 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 30.7.1-30.7.4
- https://doi.org/10.1109/cicc.1993.590831
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Relating CMOS inverter lifetime to DC hot-carrier lifetime of NMOSFETsIEEE Electron Device Letters, 1990
- Design tradeoffs between surface and buried-channel FET'sIEEE Transactions on Electron Devices, 1985