Instrumentation and data acquisition for i n s i t u electrochemistry at the Daresbury SRS
- 1 July 1989
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 60 (7) , 2386-2389
- https://doi.org/10.1063/1.1140727
Abstract
X‐ray diffraction and absorption spectroscopy provide complementary structural tools for the in situ characterization of electrode surfaces. To optimize surface sensitivity, techniques such as glancing angle scattering geometries and spectrum differencing can be employed while the application of synchrotron radiation allows the real‐time collection of data. This paper outlines recent developments in in situ electrochemistry on the Daresbury SRS and describes an electrochemical cell for in situ x‐ray studies, associated glancing angle instrumentation, together with computer hardware and software optimized for data acquisition using potential modulation techniques. Important fundamental and industrial applications are highlighted.Keywords
This publication has 5 references indexed in Scilit:
- PDA system for energy dispersive EXAFSNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1988
- In-situ grazing incidence X-ray diffraction study of electrochemically deposited Pb monolayers on Ag(111)Surface Science, 1988
- Rapid collection of X-ray powder data for pattern analysis by a cylindrical position-sensitive detectorJournal of Applied Crystallography, 1986
- In Situ X-ray diffraction studies of electrode solution interfacesElectrochimica Acta, 1986
- The blade chamber: A solution for curved gaseous detectorsNuclear Instruments and Methods in Physics Research, 1983