Structural Characterization of Pd-doped SnO2 Thin Films Using XPS

• 16 September 1996
• journal article
• research article
• Published by Wiley in Surface and Interface Analysis
• Vol. 24  (9) , 662-666
• https://doi.org/10.1002/(sici)1096-9918(19960916)24:9<662::aid-sia155>3.0.co;2-c

Abstract

Keywords

• TREATMENT
• THERMAL
• FILMS
• DIFFERENTIAL
• STRUCTURAL
• DOPED
• SNO2 THIN