Numerical techniques for the analysis of lossy films
- 1 August 1969
- journal article
- Published by Elsevier in Surface Science
- Vol. 16, 97-103
- https://doi.org/10.1016/0039-6028(69)90008-9
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Ellipsometer Study of Anomalous Absorption in Very Thin Dielectric Films on Evaporated Metals*Journal of the Optical Society of America, 1966
- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963
- Determination of the Properties of Films on Silicon by the Method of EllipsometryJournal of the Optical Society of America, 1962