Influence of Imaging Parameters and Specimen Thinning on Strain Measurements in Au/Ni MBE Multilayers by HREM Image Processing
Open Access
- 1 January 1997
- journal article
- Published by EDP Sciences in Microscopy Microanalysis Microstructures
- Vol. 8 (2) , 125-135
- https://doi.org/10.1051/mmm:1997111
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Quantitative analysis of the deformation and chemical profiles of strained multilayersUltramicroscopy, 1994
- Direct measurement of local lattice distortions in strained layer structures by HREMUltramicroscopy, 1993
- Strain-induced interdiffusion at semiconductor interfacesPhysical Review B, 1992
- EMS - a software package for electron diffraction analysis and HREM image simulation in materials scienceUltramicroscopy, 1987
- Radiation-induced processes in experiments carried out in-situ in the high-voltage electron microscopePhysica Status Solidi (a), 1979
- Accomodation of misfit between single-crystal films of nickel and copperThin Solid Films, 1970
- On spinodal decompositionActa Metallurgica, 1961