Planar Impedance Standards and Accuracy Considerations in Vector Network Analysis

1 June 1986

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

Vol. 9, 159-166
https://doi.org/10.1109/arftg.1986.323671

Abstract

An equation is given for theoretical errors in oneport corrected vector S-parameter measurements (in any transmission media). The error analysis is used to investigate parasitics peculiar to planar impedance standards. Experimental results verify the error analysis, and show that parasitics as small as 5 pH are repeatably measurable. Application to GaAsFET measurements through 26 GHz is discussed.

Keywords

IMPEDANCE
MEASUREMENT STANDARDS
REFLECTION
MICROWAVE INTEGRATED CIRCUITS
MMICS
ERROR ANALYSIS
SCATTERING PARAMETERS
TRANSMISSION LINE MEASUREMENTS
INTEGRATED CIRCUIT MEASUREMENTS
MICROWAVE THEORY AND TECHNIQUES

This publication has 1 reference indexed in Scilit:

De-Embedding and Unterminating
IEEE Transactions on Microwave Theory and Techniques, 1974