A technique for the study of Gunn devices at 9.1 GHz using a scanning electron microscope

1 July 1973

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices

Vol. 20 (7) , 610-612
https://doi.org/10.1109/T-ED.1973.17711

Abstract

A scanning electron microscope operating in the stroboscopic mode has been used to observe dynamic voltage distributions in Gunn devices oscillating at 9.1 GHz and hence to examine domain motion. The technique used in the experiment is outlined and sample results presented.

Keywords

VOLTAGE
GHZ
ELECTRON MICROSCOPE
STROBOSCOPIC
GUNN DEVICES
OUTLINED
SCANNING ELECTRON