A Simple Method for Phase-contrast Microscopy: Improvements in Technique

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Abstract
If the condenser of a microscope is first set in its so-called ‘critical’ position and then gradually lowered, the real image of the source sf light will be brought down from the plane of the diaphragm of the eyepiece till it reaches a position just behind (above) the back focal plane of the objective. If a piece of black paper, from which a ring-shaped strip has been cut away, is held immediately in front of the source of light, a bright image of the annulus can easily be thrown just behind the back focal plane of the objective by lowering the condenser to the appropriate degree. If now a phase-plate, provided with an annulus, is placed in the same plane as the image of the illuminating annulus, and if the phase-plate annulus is of such dimensions that it coincides with this image, phase-contrast microscopy will have been achieved.

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