An operational amplifier all-pass network

• 1 January 1969
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
• Vol. 57  (9) , 1677-1678
• https://doi.org/10.1109/PROC.1969.7367

Abstract

Keywords

• OPERATIONAL AMPLIFIERS
• SILICON
• BANDWIDTH
• SEMICONDUCTOR DIODES
• THERMAL RESISTANCE
• ELECTRON TRAPS
• TEMPERATURE
• IMPURITIES
• OSCILLOSCOPES
• EQUATIONS