Benefits of High‐Resolution Electron Microscopy for the Structural Characterization of Mullites
- 1 October 1991
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 74 (10) , 2359-2366
- https://doi.org/10.1111/j.1151-2916.1991.tb06769.x
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- Atomic imaging of 3:2 mulliteActa Crystallographica Section A Foundations of Crystallography, 1990
- Interpretation of HREM images of mulliteActa crystallographica Section B, Structural science, crystal engineering and materials, 1990
- Hrem Visualization of Light Atoms: An Application to the Study of Carbon Defects in Ordered Transition Metal CarbidesMRS Proceedings, 1990
- Enhancing of Small Isolated Domains and Superstructures in High Resolution Images of OxidesMRS Proceedings, 1989
- The Berkeley Atomic Resolution Microscope – an UpdateMRS Proceedings, 1989
- Minimum detectable solute concentration in atomic-resolution transmission electron microscopyActa Crystallographica Section A Foundations of Crystallography, 1988
- The incommensurate structure of mullite by Patterson synthesisActa crystallographica Section B, Structural science, crystal engineering and materials, 1987
- The diffraction aspect and a structural model of mullite, Al(Al1+2xSi1−2x)O5−xActa Crystallographica Section A, 1980
- A comparative electron-diffraction study of sillimanite and some natural and artificial mullitesMineralogical Magazine and Journal of the Mineralogical Society, 1966
- Tetragonal Mullite-like Phase from Co-precipitated GelsNature, 1961