Epitaxially induced strains in Cu2O films on copper single crystals—I X-ray diffraction effects
- 31 August 1962
- journal article
- Published by Elsevier in Acta Metallurgica
- Vol. 10 (8) , 691-697
- https://doi.org/10.1016/0001-6160(62)90038-x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A determination of thin oxide film thickness by integrated intensity measurementsActa Crystallographica, 1961
- A diffraction measurement of the structure of Cu2O films grown on copperActa Crystallographica, 1960
- The structure of oxide films on different faces of a single crystal of copperActa Metallurgica, 1956