Specimen surface effects in thick-target PIXE analysis
- 1 November 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 216 (3) , 489-495
- https://doi.org/10.1016/0167-5087(83)90517-3
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Uncertainties in thick-target PIXE analysisNuclear Instruments and Methods in Physics Research, 1983
- Uncertainties in theoretical thick target PIXE yieldsNuclear Instruments and Methods in Physics Research, 1981
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976
- Proton-induced X-ray emission in the trace analysis of human tooth enamel and dentineThe International Journal of Applied Radiation and Isotopes, 1976