Drift and low frequency noise
- 1 January 1971
- journal article
- Published by Institution of Engineering and Technology (IET) in Radio and Electronic Engineer
- Vol. 41 (2) , 61-64
- https://doi.org/10.1049/ree.1971.0018
Abstract
To compare errors arising in a measuring instrument from drift and low frequency (1/f) noise, the behaviour of the latter in the time domain is calculated. The standard deviation is expressed in terms of the cut-off frequency and integration time of the instrument, and the frequency index of the noise, which can be measured at audio frequencies. Optimum values of these quantities are discussed. The theory is illustrated by reference to measurements on m.o.s. transistors which indicate that current noise may sometimes be the main cause of ‘drift’ for periods between a day and a year.Keywords
This publication has 1 reference indexed in Scilit:
- Electrical noiseJournal of the Institution of Electrical Engineers, 1960