Nonresonant Laser–SNMS and TOF–SIMS analysis of sub-μm structures
- 1 January 2003
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 203-204, 238-243
- https://doi.org/10.1016/s0169-4332(02)00635-9
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Uniform elemental analysis of materials by sputtering and photoionization mass spectrometryNature, 1997
- Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS)Angewandte Chemie International Edition in English, 1994