Electrostatic Electron Microscopy. II
- 1 February 1943
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 14 (2) , 69-77
- https://doi.org/10.1063/1.1714953
Abstract
This paper is a continuation of the description of problems arising in the development and design of an electrostatic electron microscope. The present article discusses depth of focus, lens and field stops, shielding, manufacturing tolerances, the choice of the number of stages of magnification, and alternative methods of viewing and recording the final image. A following paper will describe a completed instrument.This publication has 3 references indexed in Scilit:
- Electrostatic Electron Microscopy. IJournal of Applied Physics, 1943
- An Electron Microscope for Practical Laboratory ServiceTransactions of the American Institute of Electrical Engineers, 1941
- A New High-Speed Cathode-Ray OscillographTransactions of the American Institute of Electrical Engineers, 1937