Four-probe resistivity measurements on rectangular semiconductor filaments
- 1 July 1956
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IRE Transactions on Electron Devices
- Vol. 3 (3) , 161-162
- https://doi.org/10.1109/t-ed.1956.14179
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- The Potentials of Infinite Systems of Sources and Numerical Solutions of Problems in Semiconductor EngineeringBell System Technical Journal, 1955
- Resistivity Measurements on Germanium for TransistorsProceedings of the IRE, 1954