Abstract
The microwave noise characteristics of poly-emitter bipolar junction transistors have been evaluated in a 0.8μm silicon BiCMOS process, at frequencies between 1 and 5.6GHz, and for collector currents between 0.5 and 15mA. Using a small-signal model for the poly-emitter bipolar junction transistors, very good agreement has been obtained between measurements and calculations of both noise figure (FMIN) against frequency, and FMIN against collector current. It is found that FMIN was 2.3dB at 1 GHZ and 8.3dB at 5.6GHZ for a collector current of 5mA.

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