Thermal sensors for investigation of heat transfer in scanning probe microscopy
- 1 July 1994
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 65 (7) , 2262-2266
- https://doi.org/10.1063/1.1145225
Abstract
Planar thermocouples designed for investigation of heat transfer in scanning tunneling microscopy and scanning thermal microscopy are described. The limit of sensitivity to local thermal power can be as small as 10 nW. The devices are based on two different thin films formed as a cross on a thin glass substrate. Heat fluxes in the cross point can be detected by measuring the thermoelectric signal from two ends of the cross. As described elsewhere planar thermocouples of this type have been successfully used to detect the energy which is deposited by tunneling electrons and to measure the heat which is coupled across a submicron vacuum gap between two metals by the fluctuating fields of electromagnetic surface modes.Keywords
This publication has 6 references indexed in Scilit:
- Thermal imaging using the atomic force microscopeApplied Physics Letters, 1993
- Microscopy of chemical-potential variations on an atomic scaleNature, 1990
- Optical absorption microscopy and spectroscopy with nanometre resolutionNature, 1989
- The heat transfer between a heated tip and a substrate: fast thermal microscopyJournal of Microscopy, 1988
- Scanning thermal profilerApplied Physics Letters, 1986
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982