Studies with the Electron Microscope Diffraction Adapter

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Abstract
The RCA diffraction adapter for its electron microscopes uses a weak magnetic lens to focus the diffraction patterns. The accuracy of the results obtained in electron diffraction analysis with such a system is discussed, and it is shown that lattice spacings may be determined with an accuracy of one percent if reasonable precautions are observed in calibration and operation of the instrument. A method is also described for measuring the accelerating voltage of the electrons from data obtained from the diffraction pattern. Electron diffraction patterns are shown of a number of thin film materials which are commonly used as specimen supports in electron diffraction analyses and electron microscopy. The effects of aging and beam exposure on the patterns produced by these films are determined.

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