The Dynamic Sensitivity and Calibration of Cathode-Ray Oscilloscopes at Very-High Frequencies

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Abstract
The drop in sensitivity of a cathode-ray oscilloscope at very-high frequencies is investigated through the extension of the simple inversion formula by introducing the exit displacement as well as the additional deflection in the stray fields. Since the actual stray field distribution cannot be predicted by any analysis, it is determined on the basis of a static or quasi-static calibration. The practical use of the somewhat complex formulas is illustrated by several examples.