A General Analysis of Steady State Photocarrier Grating Technique for the Determination of Ambipolar Diffusion Length

Publisher Website

1 January 1990

journal article
Published by Springer Nature in MRS Proceedings

Vol. 192
https://doi.org/10.1557/proc-192-299

Abstract

No abstract available

Keywords

This publication has 3 references indexed in Scilit:

DETERMINATION OF THE AMBIPOLAR DIFFUSION LENGTH BY THE STEADY STATE PHOTOCARRIER GRATING TECHNIQUE
Published by World Scientific Pub Co Pte Ltd ,1989
Ambipolar transport in amorphous semiconductors in the lifetime and relaxation-time regimes investigated by the steady-state photocarrier grating technique
Physical Review B, 1988
Steady-state photocarrier grating technique for diffusion-length measurement in semiconductors: Theory and experimental results for amorphous silicon and semi-insulating GaAs
Journal of Applied Physics, 1987