Dynamics of resonance phenomenon and negative capacitances in the dielectric response of materials
- 31 July 2000
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 77 (5) , 735-737
- https://doi.org/10.1063/1.127102
Abstract
Thermoelectric characterization performed in this work on BaFe12O19 and BaTiO3 at 1 kHz involved anomalous negative capacitances over higher temperatures. By using alternating-current analysis techniques, we ratify our previous observations on their association with an inductive component leading to a resonance-type phenomenon. The dynamics of this latter, mostly expected to act rather over higher frequencies (>106 Hz), is carefully examined by using a simple but consistent model. Its large stretching to lower frequencies is found to be caused by the inner dynamics of the material dielectric response when becoming governed, over higher temperatures, by the material–electrode interface properties.Keywords
This publication has 14 references indexed in Scilit:
- Dielectric anomaly and low frequency dispersion in ferroelectric materials at high temperaturesJournal of Materials Science, 1998
- Effect of negative capacitances on high-temperature dielectric measurements at relatively low frequencyApplied Physics Letters, 1997
- Impedance Spectroscopy of Undoped BaTiO3CeramicsJournal of the American Ceramic Society, 1996
- Limits of complex impedance spectroscopy in ionic conductor thin film measurementsSolid State Ionics, 1991
- ac impedance analysis on crystalline layered and polycrystalline bismuth titanateJournal of Applied Physics, 1991
- Anomalous behaviour of the high-temperature permittivity of polycrystalline ferroelectricsJournal of Materials Science Letters, 1991
- Electroceramics: Characterization by Impedance SpectroscopyAdvanced Materials, 1990
- Electrical properties of asingle crystalPhysical Review B, 1989
- Modeling of electrical response for semiconducting ferriteJournal of Applied Physics, 1984
- Analysis of the alternating current properties of ionic conductorsJournal of Materials Science, 1978