Formation and analysis of graded CuIn(Se1−ySy)2 films
- 1 May 2001
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 387 (1-2) , 14-17
- https://doi.org/10.1016/s0040-6090(00)01732-6
Abstract
No abstract availableKeywords
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- Profile shape functions in Rietveld refinementsJournal of Applied Crystallography, 1982
- Grain-boundary diffusion in thin films. II. Multiple grain boundaries and surface diffusionJournal of Applied Physics, 1976